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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - Shen, Ruijing, and Tan, Sheldon X -D, and Yu, Hao
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Providing readers with systematic treatments of statistical modeling and analysis of VLSI systems, this volume presents the latest developments in the field. Readers will find an analysis of each algorithm with practical applications in the context of real circuit design.

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 2014, Springer, New York, NY

ISBN-13: 9781489987877

2012 edition

Trade paperback

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 2012, Springer, New York, NY

ISBN-13: 9781461407874

Hardcover