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Statistical Modeling for Degradation Data - Chen (Editor), and Lio, Yuhlong (Editor), and Ng, Hon Keung Tony (Editor)
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All authors are experts engaged in statistical modeling in degradation data analysis Timely discussions of and presentations on methodological developments and real-world applications Data and computer programs will be made publicly available, allowing readers to replicate the model development Presents new, high-impact methods that are readily adoptable and extendable

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Statistical Modeling for Degradation Data 2018, Springer, Singapore

ISBN-13: 9789811353406

Trade paperback

Statistical Modeling for Degradation Data 2017, Springer, Singapore

ISBN-13: 9789811051937

2017 edition

Hardcover