Software Defect and Operational Profile Modeling

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE , Volume 1 Read More

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE , Volume 1 Read Less

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2012, Springer, New York, NY ISBN-13: 9781461375593 Trade paperback See All from $215.66

1998, Springer, New York, NY ISBN-13: 9780792382591 1998 edition Hardcover See All from $215.66