Skip to main content alibris logo
Self-Checking and Fault-Tolerant Digital Design - Lala, Parag K
Filter Results
Item Condition
Seller Rating
Other Options
Change Currency

With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant ...

loading
Self-Checking and Fault-Tolerant Digital Design 2000, Morgan Kaufmann Publishers, San Francisco, CA

ISBN-13: 9780124343702

Hardcover