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Scanning Tunneling Microscopy and Its Application

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Scanning Tunneling Microscopy and Its Application - Bai, Chunli
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Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, ...

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Scanning Tunneling Microscopy and Its Application 2010, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Berlin

ISBN-13: 9783642085000

Softcover reprint of hardcover 2nd edition 2000

Paperback

Scanning Tunneling Microscopy and Its Application 2000, Springer, Berlin, Heidelberg

ISBN-13: 9783540657156

2nd Rev edition

Hardcover

Scanning Tunneling Microscopy and Its Application 1995, Springer

ISBN-13: 9783540593461

Hardcover