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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications

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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications - Bruma, Alina (Editor)
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Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of ...

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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications 2020, CRC Press, London

ISBN-13: 9780367197360

Hardcover