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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Foster, Adam, and Hofer, Werner A
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Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with ...

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents 2010, Springer, New York, NY

ISBN-13: 9781441923066

Trade paperback

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents 2006, Springer, New York, NY

ISBN-13: 9780387400907

and edition

Hardcover