Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis. Mathematics are kept to a minimum with the emphasis on developing an understanding of the practical aspects of the techniques. The use of self-assessment questions to reinforce the learning process is particularly valuable.
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Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis. Mathematics are kept to a minimum with the emphasis on developing an understanding of the practical aspects of the techniques. The use of self-assessment questions to reinforce the learning process is particularly valuable.
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1987, John Wiley & Sons Ltd
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ISBN:
0471913901
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9780471913900
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122
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John Wiley & Sons Ltd
Published:
1987
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English
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17802898569
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1987, John Wiley & Sons Ltd
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New
Available Copies: 10
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ISBN:
0471913901
ISBN-13:
9780471913900
Pages:
122
Publisher:
John Wiley & Sons Ltd
Published:
1987
Language:
English
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18014075188
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1987, Wiley
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047191391X
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1987
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16665998235
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1987
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047191391X
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9780471913917
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1987
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18014312408
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1987, Wiley
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047191391X
ISBN-13:
9780471913917
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1987
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English
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18014309300
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1987,
Wiley, Chichester, England
ISBN-13: 9780471913917
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1987,
John Wiley & Sons Ltd, Chichester
ISBN-13: 9780471913900
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All Editions of Scanning Electron Microscopy and X-Ray Microanalysis