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Scanning Electron Microscope Examination of Wire Bonds from High-Reliability Devices: Nbs Technical Note 785 (Classic Reprint)

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Scanning Electron Microscope Examination of Wire Bonds from High-Reliability Devices: Nbs Technical Note 785 (Classic Reprint) - Leedy, Kathryn O
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Excerpt from Scanning Electron Microscope Examination of Wire Bonds From High-Reliability Devices: Nbs Technical Note 785 Of the several hundred sem photographs made, the examples shown were selected to be indicative of particular faults. It is not intended to suggest that the faults illustrated are unique to a particular device type, production line, or circuit configuration. In fact, most of the faults were observed to some extent in all types of the devices investi gated. About the Publisher Forgotten Books publishes ...

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Scanning Electron Microscope Examination of Wire Bonds from High-Reliability Devices: Nbs Technical Note 785 (Classic Reprint) 2018, Forgotten Books

ISBN-13: 9780364024744

Trade paperback

Scanning Electron Microscope Examination of Wire Bonds from High-Reliability Devices: Nbs Technical Note 785 (Classic Reprint) 2018, Forgotten Books

ISBN-13: 9780364941935

Hardcover