Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques
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Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques
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Add this copy of Progress in Nanoscale Characterization and Manipulation to cart. $131.11, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2019 by Springer.
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New. Print on demand Trade paperback (US). Glued binding. 508 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color. Springer Tracts in Modern Physics, 272.
Add this copy of Progress in Nanoscale Characterization and Manipulation to cart. $178.08, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2018 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
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New. Print on demand Sewn binding. Cloth over boards. 508 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color. Springer Tracts in Modern Physics, 272.
Add this copy of Progress in Nanoscale Characterization and Manipulation to cart. $120.74, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2018 by Springer.
