The book covers the fundamental theoretical bases of modern microwave measurements in the time and frequency domains, including reflectometry, spectrum analysers, vector and scalar analysers, multiports, power, noise, frequency stability and time domain reflectometry.
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The book covers the fundamental theoretical bases of modern microwave measurements in the time and frequency domains, including reflectometry, spectrum analysers, vector and scalar analysers, multiports, power, noise, frequency stability and time domain reflectometry.
Read Less
Publisher:
Institution of Engineering & Technology
Published:
1993
Language:
English
Alibris ID:
17712270977
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Standard Shipping: $4.73
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Seller's Description:
New. Trade paperback (US). Glued binding. 392 p. Materials, Circuits and Devices. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Publisher:
Institution of Engineering & Technology
Published:
1993
Language:
English
Alibris ID:
17712444271
Shipping Options:
Standard Shipping: $4.73
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Trade paperback (US). Glued binding. 392 p. Materials, Circuits and Devices. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.