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Power-Aware Testing and Test Strategies for Low Power Devices

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Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick (Editor), and Nicolici, Nicola (Editor), and Wen, Xiaoqing (Editor)
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Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions.

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Power-Aware Testing and Test Strategies for Low Power Devices 2014, Springer, New York, NY

ISBN-13: 9781489983138

2010 edition

Trade paperback

 Power-Aware Testing and Test Strategies for Low Power Devices 2009, Springer, New York, NY

ISBN-13: 9781441909275

2010 edition

Hardcover