This book discusses and compares three principle optical methods (infrared, Raman and photoluminescence analysis) for non-destructive characterization of semi-conducting materials, structures, and devices. Applications are illustrated through many case studies in silicon, GaAs, AIxGal-xAs and other important materials.
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This book discusses and compares three principle optical methods (infrared, Raman and photoluminescence analysis) for non-destructive characterization of semi-conducting materials, structures, and devices. Applications are illustrated through many case studies in silicon, GaAs, AIxGal-xAs and other important materials.
Read Less
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Seller's Description:
Good. No dust jacket. Tight Binding and clean pages. Sewn binding. Cloth over boards. 220 p. Contains: Illustrations. Techniques of Physics, 14. Audience: General/trade. Thank you for supporting the Friends of the Torrance Library.
