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Optical Characterization of Epitaxial Semiconductor Layers

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Optical Characterization of Epitaxial Semiconductor Layers - Bauer, Günther (Editor), and Richter, Wolfgang (Editor)
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The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be ...

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Optical Characterization of Epitaxial Semiconductor Layers 2011, Springer, Berlin, Heidelberg

ISBN-13: 9783642796807

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