Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems: Proceedings of the GM R&D Workshop, Bangalore, India, January 2007
Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems: Proceedings of the GM R&D Workshop, Bangalore, India, January 2007
This volume brings out the proceedings of the workshop "Next Generation Design and Veri?cation Methodologies for Distributed Embedded Control Systems" c- ducted by General Motors R&D, India Science Lab, Bangalore. This workshop is the ?rst of its kind to be organised by an automotive Original Equipment Manufacturer (OEM) to bring together the experts in the ?eld of embedded systems development to present state-of-the-art work, and to discuss future strategies for addressing the increasing complexity of embedded control ...
Read More
This volume brings out the proceedings of the workshop "Next Generation Design and Veri?cation Methodologies for Distributed Embedded Control Systems" c- ducted by General Motors R&D, India Science Lab, Bangalore. This workshop is the ?rst of its kind to be organised by an automotive Original Equipment Manufacturer (OEM) to bring together the experts in the ?eld of embedded systems development to present state-of-the-art work, and to discuss future strategies for addressing the increasing complexity of embedded control systems. The theme of the workshop is an important focus area for the current and future automotive systems. Embedded Control Systems are growing in complexity with the increased use of electronics and software in high-integrity applications for automotive and aerospace domains. In these domains, they provide for enhanced safety, automation and c- fort. Such embedded control systems are distributed, fault-tolerant, real-time systems with hybrid (discrete and continuous) behaviour. Furthermore, many of the control functions, such as by-wire controls, have stringent performance and high-integrity requirements. The research community has been addressing these challenges, and over the last few years, several design methodologies and tools for developing distributed emb- ded control systems have emerged. In spite of these, development of embedded c- trol applications remains a daunting task, requiring a great degree of human skill, expertise, time, and effort. It is imperative to invest signi?cant R&D effort in coming up with methods and tools for future embedded control applications.
Read Less
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Presents the proceedings of a workshop organized by General Motors research and development laboratory in Bangalore, India. This title coveres various areas of embedded systems development. Editor(s): Ramesh, S.; Sampath, P. Num Pages: 300 pages, biography. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 19. Weight in Grams: 636. 2007. Hardback.....We ship daily from our Bookshop.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Fine. Glued binding. Paper over boards. 300 p. Contains: Unspecified. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Glued binding. Paper over boards. 300 p. Contains: Unspecified. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Fine. XXIV, 300 p. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. XXIV, 300 p. Intended for professional and scholarly audience. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
All Editions of Next Generation Design and Verification Methodologies for Distributed Embedded Control Systems: Proceedings of the GM R&D Workshop, Bangalore, India, January 2007
