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Nanometer-scale Defect Detection Using Polarized Light

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Nanometer-scale Defect Detection Using Polarized Light - Dahoo, Pierre-Richard, and Pougnet, Philippe, and El Hami, Abdelkhalak
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of ...

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Nanometer-scale Defect Detection Using Polarized Light 2016, ISTE Ltd and John Wiley & Sons Inc, London

ISBN-13: 9781848219366

Hardcover