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Mos Interface Physics, Process and Characterization

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MOS Interface Physics, Process and Characterization - Wang, Shengkai, and Wang, Xiaolei
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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

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MOS Interface Physics, Process and Characterization 2024, CRC Press

ISBN-13: 9781032106281

Trade paperback

MOS Interface Physics, Process and Characterization 2021, CRC Press, Oxford

ISBN-13: 9781032106274

Hardcover