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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK - Cullis, A.G. (Editor), and Hutchison, John L. (Editor)
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This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were ...

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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK 2010, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Berlin

ISBN-13: 9783642068706

Paperback

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK 2006, Springer, Berlin, Heidelberg

ISBN-13: 9783540319146

2005 edition

Hardcover