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Introduction to Scanning Tunneling Microscopy Third Edition

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Introduction to Scanning Tunneling Microscopy Third Edition - Chen, C. Julian
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The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several ...

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Introduction to Scanning Tunneling Microscopy Third Edition 2021, Oxford University Press, Oxford

ISBN-13: 9780198856559

3rd edition

Hardcover