- Books
- SPIE
- Integrated circuit metrology, inspection and process control VIII : Microlithography symposium : Papers
- Book Details
- Seller
-
-
|
|
- Details:
- ISBN:
0819414913
- ISBN-13:
9780819414915
- Publisher:
SPIE
- Published:
1994
- Language:
English
- Alibris ID:
8675655294
|
- Shipping Options:
- Standard Shipping: $4.79
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- Very good. 4to, paperback. Vg condition. Ex-lib copy w/ light markings to opening pgs, spine label neatly removed; spine mildly smudged, contents bright & clean, binding tight. 553 p.
|
|
Hide Details ▴ |
|
|
|
|