The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on ...
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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.
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Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $27.77, very good condition, Sold by Half Price Books Inc rated 4.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1998 by CRC Press.
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Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $29.80, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1998 by CRC Press.
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Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $69.42, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1998 by CRC Press.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $104.95, very good condition, Sold by Mahler Books rated 5.0 out of 5 stars, ships from Pflugerville, TX, UNITED STATES, published 1998 by CRC Press.
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Very Good. 0850667585. Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean.; 24.6 X 17.4 X 1.56 centimeters; 264 pages.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $244.40, like new condition, Sold by GreatBookPricesUK5 rated 4.0 out of 5 stars, ships from Castle Donington, DERBYSHIRE, UNITED KINGDOM, published 1998 by CRC Press.
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Fine. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $257.11, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1998 by CRC Press.
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Fine. Sewn binding. Cloth over boards. 262 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
