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High-Resolution Imaging and Spectrometry of Materials

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High-Resolution Imaging and Spectrometry of Materials - Ernst, Frank (Editor), and Rühle, Manfred (Editor)
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The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission ...

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High-Resolution Imaging and Spectrometry of Materials 2010, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Berlin

ISBN-13: 9783642075254

Paperback

High-Resolution Imaging and Spectrometry of Materials 2002, Springer, Berlin, Heidelberg

ISBN-13: 9783540418184

2003 edition

Hardcover