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High Resolution Electron Microscopy of Defects in Materials: Volume 183

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High Resolution Electron Microscopy of Defects in Materials: Volume 183 - Sinclair, Robert (Editor), and Smith, David J. (Editor), and Dahmen, Ulrich (Editor)
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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High Resolution Electron Microscopy of Defects in Materials: Volume 183 2014, Cambridge University Press, Cambridge

ISBN-13: 9781107410152

Trade paperback

High Resolution Electron Microscopy of Defects in Materials: Volume 183 1990, Materials Research Society, New York

ISBN-13: 9781558990722

Hardcover