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Exafs: Basic Principles and Data Analysis - Teo, Boon K
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The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have ...

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Exafs: Basic Principles and Data Analysis 2014, Springer, Berlin, Heidelberg

ISBN-13: 9783642500336

1986 edition

Trade paperback

Exafs: Basic Principles and Data Analysis 1986, Springer

ISBN-13: 9780387158334

Hardcover