This sixth edition emphasizes staring array analysis and provides: NVIPM, TRM4, and TOD comparisons Frequency (MTF) versus spatial (pixels on target) analysis Two-dimensional versus two-directional analyses F?/d approach to modeling and system resolution In-band and out-of-band sampling artifacts Numerous trade studies
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This sixth edition emphasizes staring array analysis and provides: NVIPM, TRM4, and TOD comparisons Frequency (MTF) versus spatial (pixels on target) analysis Two-dimensional versus two-directional analyses F?/d approach to modeling and system resolution In-band and out-of-band sampling artifacts Numerous trade studies
Read Less
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Seller's Description:
Fine. No Dust Jacket as Issued. Size: 6 3/8" x 9 1/4"; FINE / NO DJ. xx, 502 pp. Completely clean, unmarked, undamaged inside and out. Book is in like-new condition, appears never used.
Publisher:
SPIE-International Society for Optical Engineering
Published:
1995
Language:
English
Alibris ID:
18076042901
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