Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis ...
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Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 650grams, ISBN: 047161307X.
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 650grams, ISBN: 047161307X.
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Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Seller's Description:
Very Good. Book Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985)
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 750grams, ISBN: 0060444444.
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 750grams, ISBN: 0060444444.
