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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques - Huhn, Sebastian, and Drechsler, Rolf
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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to ...

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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2022, Springer Nature Switzerland AG, Cham

ISBN-13: 9783030692117

Paperback

Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2021, Springer, Cham

ISBN-13: 9783030692087

2021 edition

Hardcover