This book is on dependence concepts and general methods for dependence testing. Here, dependence means data dependence and the tests are compile-time tests. We felt the time was ripe to create a solid theory of the subject, to provide the research community with a uniform conceptual framework in which things fit together nicely. How successful we have been in meeting these goals, of course, remains to be seen. We do not try to include all the minute details that are known, nor do we deal with clever tricks that all good ...
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This book is on dependence concepts and general methods for dependence testing. Here, dependence means data dependence and the tests are compile-time tests. We felt the time was ripe to create a solid theory of the subject, to provide the research community with a uniform conceptual framework in which things fit together nicely. How successful we have been in meeting these goals, of course, remains to be seen. We do not try to include all the minute details that are known, nor do we deal with clever tricks that all good programmers would want to use. We do try to convince the reader that there is a mathematical basis consisting of theories of bounds of linear functions and linear diophantine equations, that levels and direction vectors are concepts that arise rather natu- rally, that different dependence tests are really special cases of some general tests, and so on. Some mathematical maturity is needed for a good understand- ing of the book: mainly calculus and linear algebra. We have cov- ered diophantine equations rather thoroughly and given a descrip- of some matrix theory ideas that are not very widely known. tion A reader familiar with linear programming would quickly recog- nize several concepts. We have learned a great deal from the works of M. Wolfe, and K. Kennedy and R. Allen. Wolfe's Ph. D. thesis at the University of Illinois and Kennedy & Allen's paper on vectorization of Fortran programs are still very useful sources on this subject.
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0898382890. Hardcover; no dustjacket. This is an Ex-Corporate-Library copy, with all the typical markings (from a Cray Research technical library). Some rubbed surface soil to the boards. Some wear, bumping to the corner tips and spine extremities. Library labels on the covers and spine tail. There is a pocket on the rear flyleaf, and library inkstamps on the front flyleaf and rear pastedown; else no additional library markings to the pages. Else the pages are clean. A volume from the series: "The Kluwer International Series in Electrical and Computer Science".; 29A; 9-1/4" x 6"; 155 pages.
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New. Trade paperback (US). Glued binding. 155 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 60. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
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Seller's Description:
New. Trade paperback (US). Glued binding. 155 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 60. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
