Skip to main content alibris logo

Delay Fault Testing for VLSI Circuits

by ,

Write The First Customer Review
Delay Fault Testing for VLSI Circuits - Krstic, Angela, and Kwang-Ting (Tim) Cheng
Filter Results
Item Condition
Seller Rating
Other Options
Change Currency

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on ...

loading
Delay Fault Testing for VLSI Circuits 2012, Springer, New York, NY

ISBN-13: 9781461375616

Trade paperback

Delay Fault Testing for VLSI Circuits 1998, Springer, New York, NY

ISBN-13: 9780792382959

1998 edition

Hardcover