Add this copy of Defect Analysis in Electron Microscopy to cart. $81.99, good condition, Sold by The Happy Book Stack rated 4.0 out of 5 stars, ships from Bell Buckle, TN, UNITED STATES, published 1975 by Chapman and Hall.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Book may have little to no writing and/or underlining inside, and is in overall good condition. Dust jacket has small tear, this is only cosmetic and does not affect use. Fast shipping!
