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Characterisation of Radiation Damage by Transmission Electron Microscopy - Jenkins, M L, and Kirk, M a
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This book details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. It focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical ...

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Characterisation of Radiation Damage by Transmission Electron Microscopy 2000, CRC Press, Oxford

ISBN-13: 9780750307482

Hardcover