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CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies: Process-aware SRAM Design and Test

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test - Pavlov, Andrei, and Sachdev, Manoj
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test 2010, Springer, Dordrecht

ISBN-13: 9789048178551

Paperback

 CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test 2008, Springer, Dordrecht

ISBN-13: 9781402083624

2008 edition

Hardcover