Bias Temperature Instability for Devices and Circuits

This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior. Read More

This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $32.70 (Expires Feb 04, 2025) 60 Day Rental: $43.60 (Expires Mar 06, 2025) 90 Day Rental: $54.50 (Expires Apr 05, 2025) 120 Day Rental: $65.40 (Expires May 05, 2025) 180 Day Rental: $70.85 (Expires Jul 04, 2025) Buy eBook Lifetime Access: $109.00 Title: Bias Temperature Instability for Devices and Circuits Publisher: Springer Nature Print ISBN: 9781461479086, 1461479088 eText ISBN: 9781461479093 Edition: 2013 2014 edition Format: EPUB eBook	$32.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ