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Advances in X-Ray Analysis: Volume 35b - Barrett, C S (Editor), and Gilfrich, John V (Editor), and Huang, Ting C (Editor)
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Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS ...

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Advances in X-Ray Analysis: Volume 35b 2012, Springer, New York, NY

ISBN-13: 9781461365327

Trade paperback

Advances in X-Ray Analysis: Volume 35b 1992, Springer, Dordrecht

ISBN-13: 9780306442490

Hardcover