Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb ...
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Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb interaction, amongst others. Users will find a comprehensive resource on the most important aspects of particle optics at high and low energies, microlithography, image science and digital image processing. In addition, topics of interest, including electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains are presented and discussed.
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Very Good. No Dustjacket. Ex-Library. 6 x 9" A very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ----------SATISFACTION GUARANTEED---------FAST, COURTEOUS SERVICE------
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* 369 pp., Hardcover, ex library else text clean and binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* 281 pp., Hardcover, very minor library markings else text clean & binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* 338 pp., hardcover, minor library markings else text clean & binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* 405 pp., Hardcover, minor library markings else text clean & binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* xii, 330 pp., Hardcover, ex library else text clean and binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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New book (shrink wrapped NEW)! ! -No international shipping available. Sewn binding. Cloth over boards. Srlances in Imaging & Electron Physics, 9. Audience: General/trade.
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*Price HAS BEEN REDUCED by 10% until Monday, June 10 (weekend sale item)* 546 pp., hardcover, ex library else text clean and binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.