This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. Topics covered include testing and inference, nonparametric inference, the point process approach, dynamic perturbed systems, and more.
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This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. Topics covered include testing and inference, nonparametric inference, the point process approach, dynamic perturbed systems, and more.
Read Less