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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) - Erni, Rolf
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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes ...

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2015, Imperial College Press, London

ISBN-13: 9781783265282

2nd edition

Hardcover

Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction 2010, Imperial College Press, London, England

ISBN-13: 9781848165366

Hardcover