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- ISBN: 9789814322805
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ISBN: 9814322806 /
ISBN-13: 9789814322805
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- Edition:
- 2012, World Scientific Publishing Company
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- Details:
- ISBN:
9814322806
- ISBN-13:
9789814322805
- Publisher:
World Scientific Publishing Company
- Published:
2012
- Language:
English
- Alibris ID:
18014070975
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- Seller's Description:
- New, US edition. Satisfaction guaranteed! !
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- Edition:
- 2012, World Scientific Publishing Company
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New
|
- Details:
- ISBN:
9814322806
- ISBN-13:
9789814322805
- Publisher:
World Scientific Publishing Company
- Published:
2012
- Language:
English
- Alibris ID:
18060325209
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- Shipping Options:
- Standard Shipping: $4.57
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- Seller's Description:
- Brand New. New Book Original US edition, We Ship to PO BOX Address also.
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Hardcover,
New
Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, Set
by Haight, Richard A (Editor), and Ross, Frances M (Editor), and Hannon, James B (Editor)
2012, World Scientific Publishing Company
ISBN-13:
9789814322805
See Item Details ▾
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Ria Christie Books
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Uxbridge,
MIDDLESEX,
UNITED KINGDOM
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$663.98
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- Edition:
- 2012, World Scientific Publishing Company
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Hardcover,
New
|
- Details:
- ISBN:
9814322806
- ISBN-13:
9789814322805
- Publisher:
World Scientific Publishing Company
- Published:
2012
- Language:
English
- Alibris ID:
18092023185
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- Shipping Options:
- Standard Shipping: $4.57
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- Seller's Description:
- New. Glued binding. Paper over boards. 2 vols. 680 p. Materials and Energy, 2.
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