Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice (2005 edition)

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Read More

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Read Less

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2004, Springer

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ISBN	0387231161
ISBN-13	9780387231167
Pages	357
Edition	2005 edition
Publisher	Springer
Published	2004
Language	English
Alibris ID	17382902687
Available Quantity	greater than 10

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New. Sewn binding. Cloth over boards. 357 p. Contains: Illustrations, black & white, Illustrations, color.

2010, Springer-Verlag New York Inc., New York, NY ISBN-13: 9781441935748 Paperback See All from $100.01

2004, Springer, New York, NY ISBN-13: 9780387231167 2005 edition Hardcover See All from $212.29